Resist underlayer composition and method of manufacturing semiconductor integrated circuit device using the same

A resist underlayer composition and a method of manufacturing a semiconductor integrated circuit device, the composition including a solvent and an organosilane polymer, the organosilane polymer being a condensation polymerization product of at least one first compound represented by Chemical Formul...

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Hauptverfasser: WOO CHANG-SOO, KIM MI-YOUNG, KOH SANG-RAN, CHO HYEON-MO, YUN HUIAN, KIM JONG-SEOB, KIM SANG-KYUN, LEE WOO-JIN
Format: Patent
Sprache:eng
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Zusammenfassung:A resist underlayer composition and a method of manufacturing a semiconductor integrated circuit device, the composition including a solvent and an organosilane polymer, the organosilane polymer being a condensation polymerization product of at least one first compound represented by Chemical Formulae 1 and 2 and at least one second compound represented by Chemical Formulae 3 to 5.