Using magnetometer data to calculate angular rate measurement bias

Implementations are disclosed for using magnetometer measurements to estimate bias for angular rate measurements provided by an angular rate sensor (e.g., a gyro sensor). In some implementations, a bias estimator running on a device is configured to determine if the device is rotating based on the m...

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Bibliographische Detailangaben
Hauptverfasser: ZHANG HENGLIANG, PHAM HUNG A
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Implementations are disclosed for using magnetometer measurements to estimate bias for angular rate measurements provided by an angular rate sensor (e.g., a gyro sensor). In some implementations, a bias estimator running on a device is configured to determine if the device is rotating based on the magnetometer measurements. If the device is not rotating, a dynamic bias is calculated and added to a temperature compensated static bias to provide a total angular rate measurement bias. The total angular rate measurement bias can be provided to an attitude estimation system where it is used to update an attitude (orientation) of the device. In some implementations, the angular rate measurements are used to determine if the device is oscillating according to a threshold value. If the device is not rotating and the device is oscillating according to a threshold value, the static bias is updated in a calibration table.