Methods of manufacturing semiconductor devices

In a method of manufacturing a semiconductor device, an insulating interlayer is formed on a substrate. The insulating interlayer is partially removed to form an opening. A barrier conductive layer is formed on a sidewall and a bottom of the opening. An RF sputtering process and a DC sputtering proc...

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Bibliographische Detailangaben
Hauptverfasser: JANG WOO-JIN, KIM HUN, NOH WOOOEL, SHIN HONG-JAE, MOON HYO-JEONG
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:In a method of manufacturing a semiconductor device, an insulating interlayer is formed on a substrate. The insulating interlayer is partially removed to form an opening. A barrier conductive layer is formed on a sidewall and a bottom of the opening. An RF sputtering process and a DC sputtering process are performed independently on the barrier conductive layer to form a seed layer. A plated layer is formed on the seed layer.