Probe mechanism for machine tool
A contacting or non-contacting probe (2) is mounted to a spindle (6), preferably a tool spindle, of a machining device, such as a chamfering device (4), whereby it has a home position retracted out of the way of the machining (e.g. chamfering) process and an active position where it can contact a wo...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | A contacting or non-contacting probe (2) is mounted to a spindle (6), preferably a tool spindle, of a machining device, such as a chamfering device (4), whereby it has a home position retracted out of the way of the machining (e.g. chamfering) process and an active position where it can contact a workpiece before or after the machining (e.g. chamfering) process. |
---|