Selective test pattern processor
A method, system, and computer program product to test a semiconductor device are described. The method includes receiving a set of test patterns for testing the semiconductor device and a user selecting a subset of the set of test patterns. The method also includes cataloging a content of pattern f...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | A method, system, and computer program product to test a semiconductor device are described. The method includes receiving a set of test patterns for testing the semiconductor device and a user selecting a subset of the set of test patterns. The method also includes cataloging a content of pattern files associated with the subset of the set of test patterns to generate a catalog, and processing the catalog to output test data to the semiconductor device. |
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