Semiconductor integrated circuit device and microcontroller

To have a problem of occurrence of the same failure in failure detection of a microcontroller. A microcontroller has a CPU and a data access control circuit. The data access control circuit performs two types of accesses: an individual access in which a data access of the CPU is performed for each t...

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Bibliographische Detailangaben
Hauptverfasser: YASUMASU TAKASHI, YAMADA TSUTOMU, YAMADA HIROMICHI, ISHIGURO YUICHI, FUKUDA KAZUYOSHI, NAKADA YOSHIYUKI, HAGIWARA KESAMI, KANEKAWA NOBUYASU
Format: Patent
Sprache:eng
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Zusammenfassung:To have a problem of occurrence of the same failure in failure detection of a microcontroller. A microcontroller has a CPU and a data access control circuit. The data access control circuit performs two types of accesses: an individual access in which a data access of the CPU is performed for each thread, and a shared access in which a data access of the CPU is performed by executing two threads. The data access control circuit detects a failure of the CPU by making a comparison between the command and the address, respectively, in the shared access generated by executing the two threads.