Simulation based system and method for gate oxide reliability enhancement

A system, method, and computer program product for improving circuit reliability via circuit schematic simulation. A circuit simulator may netlist and simulate a schematic with a reference stimulus and determine whether a circuit component is a candidate for stress analysis, and store candidate component circuit conditions. A stress test simulation may determine if candidate components are stressed by exposure to simulated conditions meeting a stress test criterion, and output information regarding stressed circuit components. Embodiments may simulate analog integrated circuitry, determine MOS component gate oxide layer area according to component length and width, and monitor conditions on components deemed most likely to be defective, including larger MOS components. A circuit simulator plug-in may avoid storing simulation output waveforms or performing layout based analysis. Embodiments may modify the netlist and/or the test stimulus to increase the percentage of stressed circuit components, including bypassing voltage regulators and adding test connections.