Method for monitoring the quality of industrial processes and system therefrom

A method for monitoring the quality of an industrial working process, which includes identifying defects of the working process, comprises acquiring at least one signal having multiple frequency components from the industrial working process, decomposing the at least one signal having multiple frequ...

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Bibliographische Detailangaben
Hauptverfasser:	D'ANGELO GIUSEPPE, PASQUETTAZ GIORGIO
Format:	Patent
Sprache:	eng
Schlagworte:	AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING CLADDING OR PLATING BY SOLDERING OR WELDING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MACHINE TOOLS MEASURING METAL-WORKING NOT OTHERWISE PROVIDED FOR MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PERFORMING OPERATIONS PHYSICS REGULATING SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDEDFOR SHAPING OR JOINING OF PLASTICS SOLDERING OR UNSOLDERING TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR TRANSPORTING WELDING WORKING BY LASER BEAM WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
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Beschreibung
Zusammenfassung:	A method for monitoring the quality of an industrial working process, which includes identifying defects of the working process, comprises acquiring at least one signal having multiple frequency components from the industrial working process, decomposing the at least one signal having multiple frequency components in signals having single frequency components, calculating the information content for each signal having a single frequency component, analyzing the information content for each signal having a single frequency component, and if the value of the information content of the signal at the lowest single frequency component does not represent a main percentage of the information content of the whole acquired signal, the acquired signal having multiple frequency components is evaluated as indicative of a working process with defects and a defect analysis step is performed on the signal having multiple frequency components.