Abnormal clock rate detection in imaging sensor arrays

Various techniques are provided to detect abnormal clock rates in devices such as imaging sensor devices (e.g., infrared and/or visible light imaging devices). In one example, a device may include a clock rate detection circuit that may be readily integrated as part of the device to provide effectiv...

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Bibliographische Detailangaben
Hauptverfasser: STRANDEMAR KATRIN, BOULANGER PIERRE, NUSSMEIER MARK, SIMOLON BRIAN, SHARP BARBARA, GOODLAND JIM, KURTH ERIC A, HÖGASTEN NICHOLAS, HOELTER THEODORE R
Format: Patent
Sprache:eng
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Zusammenfassung:Various techniques are provided to detect abnormal clock rates in devices such as imaging sensor devices (e.g., infrared and/or visible light imaging devices). In one example, a device may include a clock rate detection circuit that may be readily integrated as part of the device to provide effective detection of an abnormal clock rate. The device may include a ramp generator, a counter, and/or other components which may already be implemented as part of the device. The ramp generator may generate a ramp signal independent of a clock signal provided to the device, while the counter may increment or decrement a count value in response to the clock signal. The device may include a comparator adapted to select the current count value of the counter when the ramp signal reaches a reference signal. A processor of the device may be adapted to determine whether the clock signal is operating in an acceptable frequency range, based on the selected count value.