Method of analyzing coupling effect between signal lines in an integrated circuit
Second signal lines are selected among neighboring signal lines near a first signal line, such that the second signal lines have valid coupling capacitances with respect to the first signal line. Test signal patterns of the first signal line and the second signal lines are selected among real signal...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | Second signal lines are selected among neighboring signal lines near a first signal line, such that the second signal lines have valid coupling capacitances with respect to the first signal line. Test signal patterns of the first signal line and the second signal lines are selected among real signal patterns according to a function of the integrated circuit. At least one of a coupling noise and a coupling transition delay of the first signal line is calculated based on the test signal patterns. |
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