Electronic control apparatus and control characteristic adjustment method for the same having a label resistor for calibrating a device-variability variation

A standard characteristic which is an average characteristic of multiple samples is approximated in a polygonal-line fashion by first to third lines. The coordinate-point positions of the first and second lines at comparison adjustment points are stored as standard data in a data memory of an electr...

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Bibliographische Detailangaben
Hauptverfasser: KANZAKI SHOZO, NISHIZAKI HIROYOSHI, ARIMAI FUMIAKI
Format: Patent
Sprache:eng
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Zusammenfassung:A standard characteristic which is an average characteristic of multiple samples is approximated in a polygonal-line fashion by first to third lines. The coordinate-point positions of the first and second lines at comparison adjustment points are stored as standard data in a data memory of an electronic control apparatus. An actual-product characteristic as a calibration target is approximated in a polygonal-line fashion by first to third lines. The resistance value of a label resistor is adjusted to a value corresponding to ratios of monitoring outputs. The electronic control apparatus reads the resistance values of one or two label resistors, combines them with the stored standard characteristic, and interpolates a third line portion, thereby restoring and generating the actual-product characteristic.