Single component correcting ECC using a reducible polynomial with GF(2) coefficients

A memory system is described that provides error detection and correction after a failure of a memory component. Each block of data in the memory system includes an array of bits logically organized into R rows and C columns, including C-2 data-bit columns containing data bits, a row check bit colum...

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1. Verfasser: LOEWENSTEIN PAUL N
Format: Patent
Sprache:eng
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Zusammenfassung:A memory system is described that provides error detection and correction after a failure of a memory component. Each block of data in the memory system includes an array of bits logically organized into R rows and C columns, including C-2 data-bit columns containing data bits, a row check bit column including row-parity bits for each of the R rows in the block, and an inner check bit column including X inner check bits. The inner check bits are defined to cover bits in the array according to a set of check vectors, wherein each check vector is associated with a different bit in the array and is an element of Res(P), a residue system. Moreover, each column is stored in a different memory component, and the check bits are generated from the data bits to provide block-level detection and correction for both memory errors and a failed memory component.