System and method for ranking anomalies

System and method for ranking anomalies

Probable anomalies associated with at least one data metric may be detected across a series of windows of time series data by comparison of data to a threshold. An estimated probability of anomalies for each of the windows of time series data may be determined based on the detected probable anomalie...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: VISWANATHAN KRISHNAMURTHY, SATTERFIELD WADE J, TALWAR VANISH, WANG CHENGWEI, LAKSHMINARAYAN CHOUDUR
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
PHYSICS
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Beschreibung
Zusammenfassung:Probable anomalies associated with at least one data metric may be detected across a series of windows of time series data by comparison of data to a threshold. An estimated probability of anomalies for each of the windows of time series data may be determined based on the detected probable anomalies and the threshold. The windows of time series data may be ranked based on the estimated probabilities. Probable anomalies associated with highest ranked windows of time series data may be output to a user.