Scan method

In general, in one aspect, the disclosure features a method and system for imaging of samples, for example, imaging samples with charged particles.

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: WARD BILLY W
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:In general, in one aspect, the disclosure features a method and system for imaging of samples, for example, imaging samples with charged particles.