Bipolar electrostatic chuck for dicing tape thermal management during plasma dicing

Methods of and apparatuses for dicing semiconductor wafers, each wafer having a plurality of integrated circuits, are described. In an example, a plasma etch chamber includes a plasma source disposed in an upper region of the plasma etch chamber. A bipolar electrostatic chuck is disposed below the p...

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1. Verfasser: NANGOY ROY C
Format: Patent
Sprache:eng
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