Polarized beam, matched coincident beam path, interferometric gradiometer apparatus and method
A gravity gradient is measured interferometrically from two polarized light beams having mutually different polarization planes which reflect from opposite surfaces of two freefalling test masses. The two polarized light beams project along matched coincident beam paths and divert from the coinciden...
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Zusammenfassung: | A gravity gradient is measured interferometrically from two polarized light beams having mutually different polarization planes which reflect from opposite surfaces of two freefalling test masses. The two polarized light beams project along matched coincident beam paths and divert from the coincident paths to interact with the freefalling test masses. An enhanced level of common mode rejection of adverse influences arises from traversing the coincident beam paths. |
|---|