Scan chain in an integrated circuit

In an embodiment, a scannable storage element includes an input circuit for providing a first signal at first node based on a data input and a scan input, where the scan input is of pull-up logic in functional mode. The input circuit includes a first pull-up path comprising a switch receiving data i...

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Bibliographische Detailangaben

Hauptverfasser:	PARIKH NAISHAD NARENDRA, TIWARI PRANJAL, DUBEY AISHWARYA
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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