Scan chain in an integrated circuit

In an embodiment, a scannable storage element includes an input circuit for providing a first signal at first node based on a data input and a scan input, where the scan input is of pull-up logic in functional mode. The input circuit includes a first pull-up path comprising a switch receiving data input and a switch receiving scan enable input, and second pull-up path comprising a switch receiving scan input, first pull-down path comprising a switch receiving the scan enable input and a switch receiving the scan input, and second pull-down path comprising a switch receiving the data input. The storage element includes a shifting circuit configured to provide a second signal in response to the first signal at second node, and a scan output buffer coupled to the second node and configured to provide a scan output at a scan output terminal in response to the second signal.