Flaw scan circuit for repeatable run out (RRO) data

Improved flaw scan circuits are provided for repeatable run out data. RRO (repeatable run out) data is processed by counting a number of RRO data bits detected in a servo sector; and setting an RRO flaw flag if at least a specified number of RRO data bits is not detected in the server sector. The RR...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	ANNAMPEDU VISWANATH
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER PHYSICS
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!