Flaw scan circuit for repeatable run out (RRO) data

Improved flaw scan circuits are provided for repeatable run out data. RRO (repeatable run out) data is processed by counting a number of RRO data bits detected in a servo sector; and setting an RRO flaw flag if at least a specified number of RRO data bits is not detected in the server sector. The RR...

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1. Verfasser:	ANNAMPEDU VISWANATH
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER PHYSICS
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Beschreibung
Zusammenfassung:	Improved flaw scan circuits are provided for repeatable run out data. RRO (repeatable run out) data is processed by counting a number of RRO data bits detected in a servo sector; and setting an RRO flaw flag if at least a specified number of RRO data bits is not detected in the server sector. The RRO flaw flag can also optionally be set by detecting an RRO address mark in the servo sector; counting a number of samples in the servo sector after the RRO address mark that do not satisfy a quality threshold; and setting the RRO flaw flag when the counted number of samples that do not satisfy the quality threshold exceeds a specified flaw threshold. If the RRO flaw flag is set, the RRO data can be discarded, and/or an error recovery mechanism can be implemented to obtain the RRO data.