Performing enhanced cleaning in the formation of MOS devices

A method includes etching a semiconductor substrate to form a recess, wherein the recess extends from a top surface of the semiconductor substrate into the semiconductor substrate. An enhanced cleaning is then performed to etch exposed portions of the semiconductor substrate. The exposed portions ar...

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Bibliographische Detailangaben
Hauptverfasser: HUANG WU-PING, CHENG YU-HUNG, LI CHII-HORNG, LEE TZE-LIANG
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method includes etching a semiconductor substrate to form a recess, wherein the recess extends from a top surface of the semiconductor substrate into the semiconductor substrate. An enhanced cleaning is then performed to etch exposed portions of the semiconductor substrate. The exposed portions are in the recess. The enhanced cleaning is performed using process gases including hydrochloride (HCl) and germane (GeH4). After the enhanced cleaning, an epitaxy is performed to grow a semiconductor region in the recess.