Image examination apparatus, image examination system, and image examination method
An image examination apparatus includes a generation unit configured to generate an examination image for examining a read image; an extraction unit configured to extract, from the examination image, multiple reference points used for alignment between the examination and read images; a calculation...
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creator | FUKASE TAKAHIRO KITAI TADASHI |
description | An image examination apparatus includes a generation unit configured to generate an examination image for examining a read image; an extraction unit configured to extract, from the examination image, multiple reference points used for alignment between the examination and read images; a calculation unit configured to calculate information on misalignment between positions of the reference points and positions corresponding respectively to the reference points in the read image; an excluding unit configured to exclude a reference point from the multiple reference points, based on the information on misalignment; an alignment unit configured to perform alignment between the examination and read images based on the reference points other than the excluded reference point; and an examination unit configured to perform examination for determining whether there is a defect in the read image on the basis of a difference between the read and examination images. |
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a calculation unit configured to calculate information on misalignment between positions of the reference points and positions corresponding respectively to the reference points in the read image; an excluding unit configured to exclude a reference point from the multiple reference points, based on the information on misalignment; an alignment unit configured to perform alignment between the examination and read images based on the reference points other than the excluded reference point; and an examination unit configured to perform examination for determining whether there is a defect in the read image on the basis of a difference between the read and examination images.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; HANDLING RECORD CARRIERS ; PHYSICS ; PRESENTATION OF DATA ; RECOGNITION OF DATA ; RECORD CARRIERS</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150428&DB=EPODOC&CC=US&NR=9019526B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150428&DB=EPODOC&CC=US&NR=9019526B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>FUKASE TAKAHIRO</creatorcontrib><creatorcontrib>KITAI TADASHI</creatorcontrib><title>Image examination apparatus, image examination system, and image examination method</title><description>An image examination apparatus includes a generation unit configured to generate an examination image for examining a read image; an extraction unit configured to extract, from the examination image, multiple reference points used for alignment between the examination and read images; a calculation unit configured to calculate information on misalignment between positions of the reference points and positions corresponding respectively to the reference points in the read image; an excluding unit configured to exclude a reference point from the multiple reference points, based on the information on misalignment; an alignment unit configured to perform alignment between the examination and read images based on the reference points other than the excluded reference point; and an examination unit configured to perform examination for determining whether there is a defect in the read image on the basis of a difference between the read and examination images.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>HANDLING RECORD CARRIERS</subject><subject>PHYSICS</subject><subject>PRESENTATION OF DATA</subject><subject>RECOGNITION OF DATA</subject><subject>RECORD CARRIERS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZAj2zE1MT1VIrUjMzcxLLMnMz1NILChILEosKS3WUcjEkCyuLC5JzdVRSMxLwSKbm1qSkZ_Cw8CalphTnMoLpbkZFNxcQ5w9dFML8uNTiwsSk1PzUkviQ4MtDQwtTY3MnIyMiVACAAc8OG4</recordid><startdate>20150428</startdate><enddate>20150428</enddate><creator>FUKASE TAKAHIRO</creator><creator>KITAI TADASHI</creator><scope>EVB</scope></search><sort><creationdate>20150428</creationdate><title>Image examination apparatus, image examination system, and image examination method</title><author>FUKASE TAKAHIRO ; KITAI TADASHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US9019526B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2015</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>HANDLING RECORD CARRIERS</topic><topic>PHYSICS</topic><topic>PRESENTATION OF DATA</topic><topic>RECOGNITION OF DATA</topic><topic>RECORD CARRIERS</topic><toplevel>online_resources</toplevel><creatorcontrib>FUKASE TAKAHIRO</creatorcontrib><creatorcontrib>KITAI TADASHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>FUKASE TAKAHIRO</au><au>KITAI TADASHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Image examination apparatus, image examination system, and image examination method</title><date>2015-04-28</date><risdate>2015</risdate><abstract>An image examination apparatus includes a generation unit configured to generate an examination image for examining a read image; an extraction unit configured to extract, from the examination image, multiple reference points used for alignment between the examination and read images; a calculation unit configured to calculate information on misalignment between positions of the reference points and positions corresponding respectively to the reference points in the read image; an excluding unit configured to exclude a reference point from the multiple reference points, based on the information on misalignment; an alignment unit configured to perform alignment between the examination and read images based on the reference points other than the excluded reference point; and an examination unit configured to perform examination for determining whether there is a defect in the read image on the basis of a difference between the read and examination images.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | CALCULATING COMPUTING COUNTING HANDLING RECORD CARRIERS PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS |
title | Image examination apparatus, image examination system, and image examination method |
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