Image examination apparatus, image examination system, and image examination method

An image examination apparatus includes a generation unit configured to generate an examination image for examining a read image; an extraction unit configured to extract, from the examination image, multiple reference points used for alignment between the examination and read images; a calculation...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: FUKASE TAKAHIRO, KITAI TADASHI
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:An image examination apparatus includes a generation unit configured to generate an examination image for examining a read image; an extraction unit configured to extract, from the examination image, multiple reference points used for alignment between the examination and read images; a calculation unit configured to calculate information on misalignment between positions of the reference points and positions corresponding respectively to the reference points in the read image; an excluding unit configured to exclude a reference point from the multiple reference points, based on the information on misalignment; an alignment unit configured to perform alignment between the examination and read images based on the reference points other than the excluded reference point; and an examination unit configured to perform examination for determining whether there is a defect in the read image on the basis of a difference between the read and examination images.