Band rewrites based on error scan counts

Systems and methods are disclosed for performing band rewrites on shingled storage media based on error scan counts. In one embodiment, a device may comprise a data storage medium including a first band and a processor. The first band may include a plurality of tracks storing data in a shingled mann...

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Bibliographische Detailangaben
Hauptverfasser: HARLLEE, III PETER S, KAN UTT HENG, BIMAS WINAHYU AJI, QIANG JIAN, FELDMAN TIMOTHY R, LIM POH SENG, XIE WEN XIANG
Format: Patent
Sprache:eng
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Zusammenfassung:Systems and methods are disclosed for performing band rewrites on shingled storage media based on error scan counts. In one embodiment, a device may comprise a data storage medium including a first band and a processor. The first band may include a plurality of tracks storing data in a shingled manner where a first track at least partially overlaps a second track. The processor may be configured to receive a write command directed to the first band, increment a first rewrite count of the first band based on the write command, and when the first rewrite count exceeds a first rewrite threshold, perform a read-modify-write (RMW) operation for all of the first band. In some embodiments, a device may maintain write counts for sections of a band, and perform RMW operations on less than all of the band.