Methods of fabricating a semiconductor memory device

A method of fabricating a semiconductor memory device includes forming a hard mask pattern using a damascene method on a lower mold layer stacked on a substrate and etching the lower mold layer using the hard mask pattern as an etch mask to define a protrusion under the hard mask pattern. A support...

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Hauptverfasser: CHO SUNGII, YOON KUKHAN, JEONG SANGSUP, KIM JONG-KYU, CHOI YONG-JOON, LEE JUNSOO
Format: Patent
Sprache:eng
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Zusammenfassung:A method of fabricating a semiconductor memory device includes forming a hard mask pattern using a damascene method on a lower mold layer stacked on a substrate and etching the lower mold layer using the hard mask pattern as an etch mask to define a protrusion under the hard mask pattern. A support pattern is formed on a top surface of the etched lower mold layer, the top surface of the etched lower mold layer being located at a lower level than a top surface of the protrusion. A lower electrode supported by the support pattern is formed.