Method and apparatus for performing time domain jitter modeling
A method for modeling jitter includes generating a first delay-impacting parameter function for a first signal and a second delay-impacting parameter function for a second signal. A first delay per element function is generated from the first delay-impacting parameter function and a second delay per...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | A method for modeling jitter includes generating a first delay-impacting parameter function for a first signal and a second delay-impacting parameter function for a second signal. A first delay per element function is generated from the first delay-impacting parameter function and a second delay per element function from the second delay-impacting parameter function. A difference in path delay from the first delay per element function and the second delay per element function is identified. |
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