Method for automatically setting frequency span in a spectrum analyzer

Embodiments of this invention include a test and measurement instrument and associated methods for automatically setting frequency span in a spectrum analyzer. For example, starting with a high reference level, the power level can be automatically measured for each band. If a suitable minimum power is not found in one of the bands, the reference level can be automatically and iteratively decreased until the suitable minimum power is found, or until the most sensitive power level is reached. This assures enough sensitivity to correctly determine the signal power level and not make decisions based on noise. When power on any band is greater than the predefined noise criteria, then the band having the highest power level can be selected, and the center frequency and span for the band measuring the most power can be automatically set.