Method and apparatus for testing integrated circuits
A method for testing an electronic device includes supplying a first voltage output from a voltage regulator to a first power connection terminal of the electronic device to provide power to the electronic device, providing to the voltage regulator a second voltage on a second power connection termi...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | A method for testing an electronic device includes supplying a first voltage output from a voltage regulator to a first power connection terminal of the electronic device to provide power to the electronic device, providing to the voltage regulator a second voltage on a second power connection terminal of the electronic device that is in connection with the first power connection terminal by a first circuit of the electronic device, regulating, using the voltage regulator, the first voltage based on a comparison of the second voltage and a target voltage, and determining whether the electronic device meets a performance requirement while the first voltage is regulated. |
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