Ultrathin wafer debonding systems

Improved semiconductor wafer debonding system, method, and apparatus, including a stress-free means for multi-axis debonding utilizing a specialized tool or fixture having at least one ultrasonic transducer.

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Bibliographische Detailangaben
1. Verfasser: LEE MASAHIRO
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Improved semiconductor wafer debonding system, method, and apparatus, including a stress-free means for multi-axis debonding utilizing a specialized tool or fixture having at least one ultrasonic transducer.