Sensor assembly and method of measuring the proximity of a machine component to a sensor

A microwave sensor assembly includes a signal processing device for generating at least one microwave signal that includes a pattern of frequencies and at least one probe coupled to the signal processing device. The probe includes an emitter configured to generate an electromagnetic field from the a...

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Bibliographische Detailangaben
Hauptverfasser:	SHEIKMAN BORIS LEONID, GO STEVEN
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING ELECTRIC VARIABLES MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A microwave sensor assembly includes a signal processing device for generating at least one microwave signal that includes a pattern of frequencies and at least one probe coupled to the signal processing device. The probe includes an emitter configured to generate an electromagnetic field from the at least one microwave signal, wherein the emitter is detuned when an object is positioned within the electromagnetic field such that a loading signal is reflected from the emitter to the signal processing device.