Methods and system for on-chip decoder for array test

The present invention provides devices capable of testing the electrical performance of thin-film transistor backplane arrays and methods for their use.

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Bibliographische Detailangaben
Hauptverfasser:	VENUGOPAL SAMEER M, BAWOLEK EDWARD J, MOYER CURTIS D
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES
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Beschreibung
Zusammenfassung:	The present invention provides devices capable of testing the electrical performance of thin-film transistor backplane arrays and methods for their use.