Method and apparatus for determining storage capacity error for a data storage device

A data storage device comprising a non-volatile media including a plurality of segments, and configured to store a defect list, and a controller configured to perform a defect management process. The defect management process can include testing the plurality of segments for defects, detecting a defect in a first segment of the plurality of segments, updating the defect list to include the first segment, determining a defective space amount based on the segments in the updated defect list, determining whether the defective space amount indicates a storage capacity error, transmitting a storage capacity error signal to the test system when the defective space amount indicates the storage capacity error, and when the defective space amount does not indicate the storage capacity error, continuing to test the plurality of segments for defects until the defective space amount indicates the storage capacity error or all the segments have been tested.