Method and apparatus for robot calibrations with a calibrating device

Described herein is a method and apparatus for performing calibrations on robotic components. In one embodiment, a method for performing robotic calibrations includes moving the calibrating device across a target (e.g., a wafer chuck). Next, the method includes measuring distances between light spot...

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Hauptverfasser: SUNDAR SATISH, KRISHNASAMY SEKAR, FOLDENAUER DONALD, SHIMSHI RINAT, SAKHARE VIJAY, HUDGENS JEFFERY, FREEMAN MARVIN L, LESKA MORDECHAI
Format: Patent
Sprache:eng
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Zusammenfassung:Described herein is a method and apparatus for performing calibrations on robotic components. In one embodiment, a method for performing robotic calibrations includes moving the calibrating device across a target (e.g., a wafer chuck). Next, the method includes measuring distances between light spots from the sensors and a perimeter of the target using the sensors located on the calibrating device. Next, the method includes determining a displacement of the calibrating device relative to a center of the target. Then, the method includes determining a rotation angle of the calibrating device relative to a system of coordinates of the target. Next, the method includes calibrating a robot position of the robot based on the displacement and rotation angle of the calibrating device with respect to the target.