Method and system for high gain auto-zeroing arrangement for electronic circuits

A method and system for high gain auto-zeroing arrangement for electronic circuits. An auto-zero electronic circuit eliminates an offset associated with a test electronic circuit. The test electronic circuit includes a pair of input terminals configured to receive an input voltage signal and a pair of output terminals. The auto-zero electronic circuit includes a pair of source followers, and a pair of capacitors coupled to the output terminals of the test electronic circuit for sampling the offset associated with the test electronic circuit. The auto-zero electronic circuit also includes a differential pair coupled to the pair of source followers. A pair of diode-connected transistors, coupled to the differential pair, is configured to generate biasing voltage signals. The biasing voltage signals modulate the control terminals of a pair of input source followers of the test electronic circuit and eliminate the offset associated with the test electronic circuit.