Electrode layer structure for a thin-film transistor and process for manufacture thereof

This wiring layer structure includes: an underlying substrate of a semiconductor substrate or a glass substrate; an oxygen-containing Cu layer or an oxygen-containing Cu alloy layer which is formed on the underlying substrate; an oxide layer containing at least one of Al, Zr, and Ti which is formed...

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Bibliographische Detailangaben
Hauptverfasser: YAGUCHI KENICHI, NAKASATO YOSUKE, MAKI KAZUNARI
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:This wiring layer structure includes: an underlying substrate of a semiconductor substrate or a glass substrate; an oxygen-containing Cu layer or an oxygen-containing Cu alloy layer which is formed on the underlying substrate; an oxide layer containing at least one of Al, Zr, and Ti which is formed on the oxygen-containing Cu layer or the oxygen-containing Cu alloy layer; and a Cu alloy layer containing at least one of Al, Zr, and Ti which is formed on the oxide layer.