Method for detecting arcs in photovoltaic systems and such a photovoltaic system
The invention relates to a method for detecting arcs in a direct-current path of a photovoltaic system, wherein values of a current (IDC) of the direct-current path are detected during a repeating time frame (7) and a mean value (8) is generated, and such a photovoltaic system. In order to reliably...
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Zusammenfassung: | The invention relates to a method for detecting arcs in a direct-current path of a photovoltaic system, wherein values of a current (IDC) of the direct-current path are detected during a repeating time frame (7) and a mean value (8) is generated, and such a photovoltaic system. In order to reliably detect arcs by means of a component of the photovoltaic system, values of a voltage (UDC), of the direct-current path are detected during the time frame (7) and a mean value (8, 8') is generated, and at least one detection signal (9) and at least one detection threshold (10) are continuously calculated based on the mean values (8, 8') for the current (IDC) and the voltage (UDC) by means of a calculation method. |
|---|