Curvilinear wiring structure to reduce areas of high field density in an integrated circuit

A method for reducing areas of high field density in an integrated circuit is disclosed. In one embodiment, the method includes forming a first curvilinear wiring structure in a first interconnect layer of an integrated circuit. A second curvilinear wiring structure may be formed in a second interco...

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Bibliographische Detailangaben
Hauptverfasser: ANDERSON FELIX PATRICK, STAMPER ANTHONY KENDALL, MCDEVITT THOMAS LEDDY
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method for reducing areas of high field density in an integrated circuit is disclosed. In one embodiment, the method includes forming a first curvilinear wiring structure in a first interconnect layer of an integrated circuit. A second curvilinear wiring structure may be formed in a second interconnect layer of the integrated circuit, such that the first and second curvilinear wiring structures are substantially vertically aligned. The first curvilinear wiring structure may then be electrically connected to the second curvilinear wiring structure.