Radiological characterization device protected against parasitic ionizing radiation sources

Radiological characterization device protected against parasitic ionizing radiation sources

A radiological characterization device comprising at least one collimated radiological measuring probe, a sensitive end of which is placed in an exchangeable collimator having an opening and a field of observation. The collimator is carried by a collimator holder, the assembly consisting of collimat...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: BRENNEIS CHRISTOPHE, GIRONES PHILIPPE, LAMADIE FABRICE, DUCROS CHRISTIAN
Format: Patent
Sprache:eng
Schlagworte:
GAMMA RAY OR X-RAY MICROSCOPES
IRRADIATION DEVICES
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
NUCLEAR ENGINEERING
NUCLEAR PHYSICS
PHYSICS
TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR
TESTING
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Beschreibung
Zusammenfassung:A radiological characterization device comprising at least one collimated radiological measuring probe, a sensitive end of which is placed in an exchangeable collimator having an opening and a field of observation. The collimator is carried by a collimator holder, the assembly consisting of collimator and collimator holder being inserted in a stack between two shielding screens, the shielding screens being exchangeable so as to adjust the thickness thereof, the assembly consisting of collimator and collimator holder and the shielding screens providing protection for the probe vis-à-vis parasitic ionizing radiation coming from ionizing radiation sources situated outside the field of observation of the collimator.