Methods of forming a semiconductor device

A method and structure for a semiconductor device, the device including a handle wafer, a diamond layer formed directly on a front side of the handle wafer, and a thick oxide layer formed directly on a back side of the handle wafer, the oxide of a thickness to counteract tensile stresses of the diam...

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Bibliographische Detailangaben
Hauptverfasser: JEROME RICK C, HOOPINGARNER KEVIN, MCLACHLAN CRAIG, HEBERT FRANCOIS
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:A method and structure for a semiconductor device, the device including a handle wafer, a diamond layer formed directly on a front side of the handle wafer, and a thick oxide layer formed directly on a back side of the handle wafer, the oxide of a thickness to counteract tensile stresses of the diamond layer. Nitride layers are formed on the outer surfaces of the diamond layer and thick oxide layer and a polysilicon is formed on outer surfaces of the nitride layers. A device wafer is bonded to the handle wafer to form the semiconductor device.