Clearance measuring method and measuring unit

The present invention provides a method for measuring a clearance (13) between facing surfaces of a first member (11) and a second member (12). The method includes a step (S1) of bringing a pair of probes each having a tip end (14) slightly larger than the clearance (13) into direct contact with the...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SUEOKA HISAYUKI, YOSHIDA HIROSHI, MITSUSHIMA HIROYA, OTOMURA TATSUMI
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The present invention provides a method for measuring a clearance (13) between facing surfaces of a first member (11) and a second member (12). The method includes a step (S1) of bringing a pair of probes each having a tip end (14) slightly larger than the clearance (13) into direct contact with the clearance (13) and measuring a separation distance between the two tip ends (14), and a calculating step (S2) of calculating and measuring a clearance value (d1) on the basis of the separation distance between the tip ends (14).