System to determine fault tolerance in an integrated circuit and associated methods

A system to determine fault tolerance in an integrated circuit may include a programmable logic device carried by the integrated circuit. The system may also include a configurable memory carried by the programmable logic device to control the function and/or connection of a portion of the programmable logic device. The system may further include user logic carried by said programmable logic device and in communication with a user and/or the configurable memory. The user logic may identify corrupted data in the configurable memory based upon changing user requirements.