Systems for inspection of shrouds

A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. The system also includes an impedance measurement device that measures a total resistance associated with the at least one resistive element.

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Bibliographische Detailangaben
Hauptverfasser: ANDARAWIS EMAD ANDARAWIS, UMEH CHUKWUELOKA OBIORA
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. The system also includes an impedance measurement device that measures a total resistance associated with the at least one resistive element.