Continuous wave metal detector
A training set including a target object set and a clutter object set is accessed. It is determined that the training set includes multiple types of targets or multiple types of clutter. The target feature value of a type of target is compared with the clutter feature value. The type of target is as...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | A training set including a target object set and a clutter object set is accessed. It is determined that the training set includes multiple types of targets or multiple types of clutter. The target feature value of a type of target is compared with the clutter feature value. The type of target is associated with the non-target object based on the comparison. A classifier is trained using the target feature value and the clutter feature value of the associated type of target and the non-clutter object. A feature value associated with an unknown object is applied to multiple classifiers to generate a set of metrics for the unknown object. The metrics are aggregated into an overall metric. Whether the unknown object is included in the target set is determined based on the overall metric. |
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