Analyzing apparatus

The present invention relates to an analyzer (1) which includes a placement part (11) for placing an analysis piece, and a photometric measurer (7) for photometric measurement of the analysis piece (2). In the analyzer (1), the placement part (11) holds the analysis piece (2) in such a way that a ro...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	HONGO YOSHIKIYO, SUGIE HISAKAZU, OTSUKI TOSHIYUKI, NISHIDA NORIMASA, TAKAGI YASUMITSU
Format:	Patent
Sprache:	eng
Schlagworte:	CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PERFORMING OPERATIONS PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL PHYSICS TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION TECHNICAL SUBJECTS COVERED BY FORMER USPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TESTING TRANSPORTING
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Beschreibung
Zusammenfassung:	The present invention relates to an analyzer (1) which includes a placement part (11) for placing an analysis piece, and a photometric measurer (7) for photometric measurement of the analysis piece (2). In the analyzer (1), the placement part (11) holds the analysis piece (2) in such a way that a row of reagent pad (20) on the analysis piece (1) lie in right-and-left directions (D3, D4). The photometric measurer (7) is farther from a front than the placement part (11). The analysis piece (2) placed on the placement part (11) is conveyed from front toward rear (Direction D1), with the row of reagent pads (20) laid in right-and-left directions (D3, D4), toward the photometric measurer (7).