Apparatus and method for monitoring current flow to integrated circuit in temperature-compensated manner
A circuit and method for monitoring current flow to an integrated circuit (IC), alone or mounted on a substrate, in a temperature-compensated manner. In accordance with a preferred embodiment, a plurality of resistances having substantially equal temperature coefficients establishes a ratio of an ou...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | A circuit and method for monitoring current flow to an integrated circuit (IC), alone or mounted on a substrate, in a temperature-compensated manner. In accordance with a preferred embodiment, a plurality of resistances having substantially equal temperature coefficients establishes a ratio of an output voltage and an internally measured voltage, with the output voltage corresponding to a voltage drop across an inherent resistance within the IC or on the substrate. |
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