Inspection system and inspecting method

An inspection system for inspecting a processing accuracy of a work piece is provided. The inspection system includes a supporting mechanism which supports the work piece in a same posture as a posture in which the work piece is assembled to a body; a load reproduction device which applies a load to...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	KOZASA NOBUHIRO, IKEDA TAKAFUMI, YOSHIMICHI HITOSHI, KAMIYAMA MICHIO
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	An inspection system for inspecting a processing accuracy of a work piece is provided. The inspection system includes a supporting mechanism which supports the work piece in a same posture as a posture in which the work piece is assembled to a body; a load reproduction device which applies a load to the work piece along a substantially vertical direction; and a measurement device which measures positions of at least one characteristic portion of the work piece while the load is being applied to the work piece.