Probing analog signals
A device, comprising a monitoring slicer adapted to repeatedly sample an internal analog signal to provide a sequence of digital outputs indicating a result of a comparison of the level of the internal analog signal to a reference voltage and an operative unit adapted to perform a task of the device...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | A device, comprising a monitoring slicer adapted to repeatedly sample an internal analog signal to provide a sequence of digital outputs indicating a result of a comparison of the level of the internal analog signal to a reference voltage and an operative unit adapted to perform a task of the device and provide a result without using digital outputs from the monitoring slicer. |
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