Probing analog signals

A device, comprising a monitoring slicer adapted to repeatedly sample an internal analog signal to provide a sequence of digital outputs indicating a result of a comparison of the level of the internal analog signal to a reference voltage and an operative unit adapted to perform a task of the device...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: MEZER AMIR, BENHAMOU ASSAF
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A device, comprising a monitoring slicer adapted to repeatedly sample an internal analog signal to provide a sequence of digital outputs indicating a result of a comparison of the level of the internal analog signal to a reference voltage and an operative unit adapted to perform a task of the device and provide a result without using digital outputs from the monitoring slicer.