Methodologies and tool set for IDDQ verification, debugging and failure diagnosis

Quiescent supply current (IDDQ) verification, prediction, and debugging of low power semiconductor devices are enhanced by IDDQ defect diagnosis. If all IDDQ patterns fail verification, per module analysis is performed to sort out potential module design issues or cell constraint issues. For issues...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LAISNE MICHAEL, PAN XIANGDONG, NGUYEN TRIPHUONG, ZUO SONGLIN, CUI HAILONG
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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