Method for fabricating semiconductor device with buried gates

A method for fabricating a semiconductor device, including forming a trench by etching a semiconductor substrate, forming a gate insulation layer over a surface of the trench, forming a gate conductive layer over the gate insulation layer, performing a first recess process by etching the gate conduc...

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1. Verfasser: SONG PIL-GEUN
Format: Patent
Sprache:eng
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Zusammenfassung:A method for fabricating a semiconductor device, including forming a trench by etching a semiconductor substrate, forming a gate insulation layer over a surface of the trench, forming a gate conductive layer over the gate insulation layer, performing a first recess process by etching the gate conductive layer, forming a protection pattern over the gate insulation layer, and performing a second recess process by etching the gate conductive layer.