Method of forming a metal layer and a method of fabricating a semiconductor device

A method of forming metal films includes preparing a substrate, on which an insulating layer and a metal layer formed of a first metal are exposed; and forming a metal capping layer by supplying an organic precursor of a second metal onto the substrate to deposit the second metal simultaneously on t...

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Bibliographische Detailangaben
Hauptverfasser: CHOI GIL-HEYUN, JUNG EUN-JI, KIM BYUNG-HEE, SOHN WOONG-HEE, KIM SU-KYOUNG
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method of forming metal films includes preparing a substrate, on which an insulating layer and a metal layer formed of a first metal are exposed; and forming a metal capping layer by supplying an organic precursor of a second metal onto the substrate to deposit the second metal simultaneously on the insulating layer and the metal layer, wherein the second metal capping layer has different thicknesses on the insulating layer and the metal layer.